发明名称 Wordline activation delay monitor using sample wordline located in data-storing array
摘要 A wordline activation delay monitor circuit is disclosed herein which includes a sample wordline located within a data-storing array of a memory, wherein the sample wordline is selected or activated by circuitry having substantially the same structure or location within the memory as circuitry which selects or activates wordlines of the data-storing array. A circuit is disclosed which determines a wordline activation delay for a first subarray group within the memory by activating a sample wordline which is located within a data-storing array of a second subarray group. Corresponding methods are also disclosed.
申请公布号 US6115310(A) 申请公布日期 2000.09.05
申请号 US19990225343 申请日期 1999.01.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 NETIS, DMITRY G.;JI, L. BRIAN;KIRIHATA, TOSHIAKI
分类号 G11C8/14;G11C8/18;G11C11/408;G11C11/4091;(IPC1-7):G11C7/02 主分类号 G11C8/14
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