发明名称 Semiconductor tester with remote debugging for handler
摘要 A semiconductor tester at a first station includes a device handler operating under control of a first computer located at the first station. The handler is provided with a video camera having an output connected to a port of the first computer. A second computer, which includes a display monitor, is located at a second station, which is remote from the first station, and the first and second computers are connected in a computer network. The video camera is employed to acquire an image of the handler and the video camera provides the first computer with video data representative of this image. The video data is transmitted over the computer network to the second computer and is provided to the display monitor, whereby the image acquired by the video camera can be viewed on the display monitor. Information regarding operation of the device handler is transmitted from the second station to the first station.
申请公布号 US6115645(A) 申请公布日期 2000.09.05
申请号 US19970914581 申请日期 1997.08.18
申请人 CREDENCE SYSTEMS CORPORATION 发明人 BERAR, ANDREI
分类号 G01R31/317;G01R31/319;(IPC1-7):G11C8/00 主分类号 G01R31/317
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