发明名称 Total ion number determination in an ion cyclotron resonance mass spectrometer using ion magnetron resonance
摘要 The total number of ions created br obtained during an ionization or ion introduction event in a Fourier transform ion cyclotron resonance mass spectrometer are determined either by using an on-resonance experimental technique or an off-resonance experimental technique. Both techniques exploit ion magnetron motion. In the on-resonance technique the spectrometer is excited in the magnetron mode and the single resonance signal resulting from this excitation is detected to determine the total number of ions. In the off-resonance technique the magnetron mode is excited at a frequency that is near the magnetron frequency while simultaneously detecting the resulting ion motion. The off-resonance technique leaves the ion population in a state that is amenable to subsequent analysis.
申请公布号 US6114692(A) 申请公布日期 2000.09.05
申请号 US19980086611 申请日期 1998.05.28
申请人 SIEMENS APPLIED AUTOMATION, INC. 发明人 BEU, STEVEN C.
分类号 H01J49/38;H01J49/42;(IPC1-7):H01J49/00;B01D59/44 主分类号 H01J49/38
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