发明名称 Method of manufacturing an isolation region in a semiconductor device using a flowable oxide-generating material
摘要 A method for the manufacture of a semiconductor device with trench isolation regions includes forming at least one trench in a substrate to define one or more isolation regions. At least a portion of the trench is filled with a flowable oxide-generating material which is then formed into an oxide layer. An optional dielectric layer can be deposited over the oxide layer. A portion of the oxide layer and/or the optional dielectric layer is removed to generate a substantially planer surface.
申请公布号 US6114219(A) 申请公布日期 2000.09.05
申请号 US19970929865 申请日期 1997.09.15
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SPIKES, JR., THOMAS E.;SUN, SEY-PING;DAWSON, ROBERT
分类号 H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/762
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