发明名称 Semiconductor memory circuit with a control circuit rising cell drain potential slowly
摘要 A semiconductor memory circuit includes a memory cell subarray, a subarray driver and a cell drain potential generator. The memory cell subarray includes word lines, memory cell transistors and a cell drain line selection transistor. Each of the memory cell transistors has a gate connected to one of the word lines, a drain and a source. The cell drain line selection transistor has a first terminal connected to the drains of the memory cell transistors, a second terminal and a gate. The semiconductor memory circuit further has a subarray driver connected to the gate of the cell drain line selection transistor for applying a predetermined potential to the cell drain line selection transistor in response to a write control signal and an address signal, and a cell drain potential generator connected to the second terminal of the cell drain line selection transistor for providing a cell drain potential to the second terminal of the cell drain line selection transistor in response to the write control signal. The cell drain potential generator has a delay circuit for slowly rising the cell drain potential.
申请公布号 US6115297(A) 申请公布日期 2000.09.05
申请号 US19990333581 申请日期 1999.06.15
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 NAGATOMO, MASAHIKO
分类号 G11C16/02;G11C7/12;G11C16/06;(IPC1-7):G11C7/00 主分类号 G11C16/02
代理机构 代理人
主权项
地址