CONSTANT TEMPERATURE CHAMBER IN A HANDLER FOR SEMICONDUCTOR DEVICE TESTING APPARATUS,申请号KR19960032952-传众专利搜索

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发明名称	CONSTANT TEMPERATURE CHAMBER IN A HANDLER FOR SEMICONDUCTOR DEVICE TESTING APPARATUS
摘要
申请公布号	KR100264524(B1)	申请公布日期	2000.09.01
申请号	KR19960032952	申请日期	1996.08.08
申请人	ADVANTEST CORP.	发明人	FUKUMOTO KEIICHI
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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