发明名称 |
New double-sided polished semiconductor wafer has extremely low front face site front surface-referenced least squares ratio planarity values varying insignificantly between the wafer edge and central regions |
摘要 |
A semiconductor wafer has extremely low front face site front surface-referenced least squares ratio (SFQR) values varying insignificantly between the wafer edge and central regions. Semiconductor wafer has a front face with a maximum local planarity value (SFQRmax) of <= 0.13 microns m and individual SFQR values in the wafer edge region which do not differ significantly from those in the central region. An Independent claim is also included for a double-sided polishing process for producing the above wafer, in which the wafer thickness is initially 20-200 microns m greater than the carrier thickness and, after polishing, is 2-20 microns m greater than the carrier thickness.
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申请公布号 |
DE19905737(A1) |
申请公布日期 |
2000.08.31 |
申请号 |
DE19991005737 |
申请日期 |
1999.02.11 |
申请人 |
WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG |
发明人 |
ALTMANN, THOMAS;WENSKI, GUIDO;BERNWINKLER, WILLI;FEUCHTINGER, ERNST;HEIER, GERHARD;WINKLER, WOLFGANG |
分类号 |
H01L21/306;B24B37/04;H01L21/02;H01L21/302;H01L21/304;H01L21/4763;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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