发明名称 OBJECTIVE LENS FOR REDUCING MICROLITHOGRAPHY AND PROJECTION AND EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an objective lens for projection being suitable for short- wavelength lithography. SOLUTION: This objective lens for projection is used for the short- wavelength microlithography whose wavelength is preferably <=100 nm. Besides, it is provided with six mirrors, that means, the 1st mirror S1 to the 6th mirror S6 arranged so that numerical aperture(NA) at an image side becomes NA >=0.15. Then, the 5th mirror S5 arranged at a position being nearest to a wafer surface 4 is arranged so as to be separated at a prescribed distance from the wafer surface.
申请公布号 JP2000235144(A) 申请公布日期 2000.08.29
申请号 JP20000033981 申请日期 2000.02.10
申请人 CARL ZEISS STIFTUNG TRADING AS CARL ZEISS 发明人 UDO DINGEL
分类号 G02B11/00;G02B13/24;G02B17/06;G03F7/20;H01L21/027;(IPC1-7):G02B11/00 主分类号 G02B11/00
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