发明名称 |
Semiconductor integrated circuit and test method therefor |
摘要 |
A reconfigurable circuit is reconstructed to three or more operating circuit blocks. Upon testing, the same data is inputted to each of the reconstructed operating circuit blocks. A majority circuit formed in the reconfigurable circuit compares results of operations of the operating circuit blocks and outputs information indicating which of the operating circuit blocks is in trouble.
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申请公布号 |
US6112163(A) |
申请公布日期 |
2000.08.29 |
申请号 |
US19980038373 |
申请日期 |
1998.03.11 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OOWAKI, YUKIHITO;SEKINE, MASATOSHI;FUJII, HIROSHIGE |
分类号 |
G01R31/317;G01R31/3185;G06F11/22;(IPC1-7):G01R15/12 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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