发明名称 Semiconductor integrated circuit and test method therefor
摘要 A reconfigurable circuit is reconstructed to three or more operating circuit blocks. Upon testing, the same data is inputted to each of the reconstructed operating circuit blocks. A majority circuit formed in the reconfigurable circuit compares results of operations of the operating circuit blocks and outputs information indicating which of the operating circuit blocks is in trouble.
申请公布号 US6112163(A) 申请公布日期 2000.08.29
申请号 US19980038373 申请日期 1998.03.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OOWAKI, YUKIHITO;SEKINE, MASATOSHI;FUJII, HIROSHIGE
分类号 G01R31/317;G01R31/3185;G06F11/22;(IPC1-7):G01R15/12 主分类号 G01R31/317
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