发明名称 Nonvolatile semiconductor storage device
摘要 A nonvolatile semiconductor storage device includes a repair request global flag for storing information indicating whether any faulty memory cell has been detected in the repair judgment test; and two tag memories, one for storing information indicating the word line associated with a faulty memory cell detected in the repair judgment test, the other tag memory storing bit line information associated with the detected faulty memory cell. A write state machine controls the data written to the repair request global flag and tag memories, and a write state machine algorithm storage section stores algorithms for which the write state machine executes a writing operation to the repair request global flag and tag memories.
申请公布号 US6112321(A) 申请公布日期 2000.08.29
申请号 US19970001555 申请日期 1997.12.31
申请人 SHARP KABUSHIKI KAISHA 发明人 SHIMADA, KAZUYUKI;MURAI, TAKASHI
分类号 G01R31/28;G11C29/00;G11C29/44;(IPC1-7):G11C29/00 主分类号 G01R31/28
代理机构 代理人
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