发明名称 Method for forming titanium silicide in situ
摘要 Titanium is sputtered in an ionized metal plasma sputtering chamber to form titanium silicide in situ in the bottom of openings onto silicon in a series of steps that change the temperature and deposition conditions of sputtering. Ionized titanium is sputtered cold, the temperature is rapidly increased by passing argon through the heated substrate support without sputtering, thereby initiating titanium silicide formation, and then the sputtering of titanium ions is continued at high temperatures to deposit titanium silicide. To deposit titanium silicide in very high aspect ratio openings, a first layer of titanium atoms is sputter deposited in conventional manner to line the sidewalls of the openings, followed by sputtering from a plasma and continuing with the above process.
申请公布号 US6110821(A) 申请公布日期 2000.08.29
申请号 US19980013823 申请日期 1998.01.27
申请人 APPLIED MATERIALS, INC. 发明人 KOHARA, GENE Y.;CHEN, FUSEN;LEVINSTEIN, HYMAN JOSEPH;XU, ZHENG;DING, PEIJUN;YAO, GONGDA;ZHANG, HONG
分类号 C23C14/18;C23C14/54;H01L21/285;H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 C23C14/18
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