发明名称 Scanning X-ray fluorescence analyzer
摘要 Disclosed is a scanning x-ray fluorescence spectrometer for measuring accurately the content of a randomly distributed element contained in a sample. Said device comprising a linear excitation source of radioactive material in a holder which produces a beam of ionizing radiation capable of exciting the emission of primary x-rays of the said element from said sample. The sample is mechanically drawn through said beam in a direction perpendicular to the axis of said source, thus exposing the entire sample to a uniform radiation flux. A linear radiation detector is positioned on a plane parallel to said sample and said source, positioned such that its sensitive area faces said sample at the point where the most intense portion of said beam passes through said sample, thus achieving a uniform collection of x-rays from the sample. A personal computer provides calibration, motor control and data analysis capability including an algorithm to convert nuclear data into an accurate reading of the concentration of the element in the sample.
申请公布号 US6111929(A) 申请公布日期 2000.08.29
申请号 US19970818758 申请日期 1997.03.14
申请人 XRF CORPORATION 发明人 HAZLETT, THOMAS
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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