发明名称 METHOD FOR MEASURING DISPLACEMENT OF CANTILEVER IN SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To improve the detection sensitivity of the displacement of a cantilever. SOLUTION: A light beam OB1 from a light source 1 is appropriately focused at the side of a sample 5 from the reverse side (a surface that is opposite to a sample surface side) of a cantilever 2. Namely, the beam is underfocused on the reverse side. Then, the image of a just focus image P' (the real image of the light source) is formed at the symmetrical position of a just focus image P (the imaginary image of the light source) at a light detection side (light source side) in reference to the reverse side. Then, a reflection light beam from the reverse side enters the light reception surface of a photo detector 4 according to an optical diagram as shown by RB1, so that the spot diameter of a reflection light beam on the light reflection surface becomes S1, which is extremely smaller than a conventional case where the image is just focused on the reverse side, thus improving the detection sensitivity of the displacement of the cantilever 2 due to the photo detector 4.
申请公布号 JP2000234994(A) 申请公布日期 2000.08.29
申请号 JP19990037110 申请日期 1999.02.16
申请人 JEOL LTD 发明人 SUZUKI KATSUYUKI
分类号 G01B11/00;G01B21/30;G01C3/06;G01N37/00;G01Q20/02;G01Q60/24;G01Q60/38;G12B1/00;(IPC1-7):G01N13/16 主分类号 G01B11/00
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