发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory structure having a constitution of a memory cell array which can process many input/output data simultaneously in parallel and a redundant relieving circuit which can perform efficiently redundant relieving for the above. SOLUTION: A memory cell array 50 is provided with a regular memory cell array divided into plural memory mats 55, a row redundant circuit 70, and a column redundant circuit 80. A data line is provided independently for each of the regular memory cell array, the row redundant circuit 70, and the column redundant circuit 80. Each data input/output line is connected selectively to a global data bus GDB by a data line shift circuit 75. When an address signal coincides with a defective address, a redundant control circuit 60 generates a shift setting signal corresponding to a defective address, and a connection mode in the data shift circuit 75 is set.
申请公布号 JP2000235800(A) 申请公布日期 2000.08.29
申请号 JP19990033874 申请日期 1999.02.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 OISHI TSUKASA
分类号 G11C29/04;G11C7/10;G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/04
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