发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To reduce stresses applied to a semiconductor chip and a connection member in the connection of the semiconductor chip and wiring board typified by flip-chip mounting. SOLUTION: A semiconductor chip 1 and a wiring board 2 for mounting it are bonded by a melted solder bump 3. The thickness ratio of the semiconductor chip 1 and the wiring board 2 is determined, based on the modulus of elasticity of the semiconductor chip 1 and that of wiring board 2 so that the maximum deflection of the semiconductor chip 1 and that of the wiring board 2 are made the same value. Consequently, the stress applied to the semiconductor chip 1 and solder bump 3 by thermal stress or an external force is reduced and optimized at the same time. Also, the reliability of a semiconductor device can be improved.
申请公布号 JP2000236042(A) 申请公布日期 2000.08.29
申请号 JP19990037538 申请日期 1999.02.16
申请人 NEC CORP 发明人 UCHIDA HIROYUKI
分类号 H05K1/18;H01L23/12;H05K1/02;(IPC1-7):H01L23/12 主分类号 H05K1/18
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