发明名称 Automatic sample changer for an X-ray diffractometer
摘要 A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples-each showing a surface, which meets the goniometer axis at a tangent in the measurement position-are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.
申请公布号 US6111930(A) 申请公布日期 2000.08.29
申请号 US19980192387 申请日期 1998.11.16
申请人 BRUKER AXS ANALYTICAL X-RAY SYSTEMS GMBH 发明人 SCHIPPER, ROLF
分类号 G01N23/20;(IPC1-7):G01N23/00;B01L3/00 主分类号 G01N23/20
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