发明名称 Plasma processing method and plasma processing apparatus
摘要 A plasma processing method in which a high-frequency power is supplied to a processing chamber in which an object to be processed is mounted, thereby producing a plasma in the processing chamber, and the object is processed in an atmosphere of the plasma, wherein the high-frequency power is subjected to modulation by a low-frequency power. In one embodiment a plasma is produced in a processing chamber by using an electric power with a direction of current changed with passing of time, and the object to be processed is processed in an atmosphere of the plasma, wherein a power having a basic frequency is subjected to frequency modulation with a frequency equal to n-times (n=an integer) the basic frequency. In a plasma processing apparatus of the invention, while a process gas is supplied to a processing chamber via a first gas introducing hole formed in an electrode, an object to be processed, which is held on an opposed electrode, is subjected to plasma processing. There is provided a resistance applying [means for applying] apply resistance to the process gas flowing to the processing chamber via the gas introducing hole from the gas introducing means such that a plasma discharge is prevented from occurring in the gas introducing means when a process pressure in the processing chamber is set at 0.5 Torr or less.
申请公布号 US6110287(A) 申请公布日期 2000.08.29
申请号 US19970843129 申请日期 1997.04.28
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON YAMANASHI LIMITED 发明人 ARAI, IZUMI;TAHARA, YOSHIFUMI;NISHIKAWA, HIROSHI;MITANO, YOSHINOBU;IIMURO, SHUNICHI;FUKASAWA, KAZUO;MIURA, YUTAKA;HOSODA, SHOZO
分类号 C23C16/509;H01J37/32;H01L21/00;(IPC1-7):C23C16/00 主分类号 C23C16/509
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