| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce the circuit scale for a continuity test. SOLUTION: An input signal is input from input pads 1No to 1Nn to an inner circuit 16 via an inner bus BLin during normal operation. The inner circuit 16 outputs an output signal via a bus drive circuit 15, an inner bus BLout, an output buffer 13 and output pads DQ0 to DQn on response to an input signal. A test circuit 14 is connected to the inner bus BLout, and the test circuit 14 outputs a response signal via the inner bus BLout, the output buffer 13 and the output pads DQ0 to DQn, in response to a signal input to the input pads IN, IN0 to INn during a continuity test. Energized state between the external terminal of an SDRAM and a bus wiring on a board is verified by the signal. |
