发明名称 APPARATUS FOR MEASURING IMPEDANCE OF RESONANT STRUCTURE
摘要 PURPOSE: An apparatus is provided to remove the need for the controlling electronics to be mounted near the structure, and to allow the impedance of the structure to be measured with very low signal power. CONSTITUTION: An apparatus for measuring the value of a physical quantity which affects the impedance of an electrically resonant structure, the apparatus comprising an electrically resonant structure, an RF electrical energy source, a bidirectional RF transmission line connecting the source to the resonant structure, a directional coupler associated with the transmission line, the source providing an excitation signal to the structure, the directional coupler detecting the voltage or phase of a reflected signal returned from the resonant structure characterized in that the resonant structure is substantially non energy radiating and, at a given frequency of the source, has an impedance which varies continuously as a function of the value of the physical quantity.
申请公布号 KR20000053214(A) 申请公布日期 2000.08.25
申请号 KR19997004182 申请日期 1999.05.12
申请人 LONSDALE, ANTHONY;LONSDALE, BRYAN 发明人 LONSDALE BRYAN;LONSDALE ANTHONY
分类号 G01R27/06;G01R27/26;G01R27/28;(IPC1-7):G01R27/06 主分类号 G01R27/06
代理机构 代理人
主权项
地址