| 摘要 |
PURPOSE: A semiconductor testing device is provided to minimize the decrease of the numbers of concurrently tested device though the numbers of input/output terminals of a device to be test is exceeding the numbers of test circuit block of semiconductor device tester. CONSTITUTION: A semiconductor testing device comprising a terminal of a device(3) to be test contacted to a driver's(1) single output terminal and a comparator's(2) single input terminal. The comparator's(2) output is applied on a pass/fail decision circuit(4). The pass/fail decision circuit(4)'s output is applied on a DUT EDIT circuit(6). A single test circuit block have many driver(1), comparator(2) and pass/fail decision circuit(4). The composition of driver(1), comparator(2) and pass/fail decision circuit(4) are corresponding to a single terminal of a device to be test. The DUT EDIT circuit(6) outputs the FAIL output of a DUT(1), FAIL output of a DUT(2),...FAIL output of a DUT(n).
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