发明名称 |
SEMICONDUCTOR CRYSTALLINE, IT'S FABRICATION METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: Semiconductor crystalline, it's process and semiconductor device is provided to depress the deterioration of the crystalline structure followed by heat treatment on a SiGeC layer; CONSTITUTION: Semiconductor crystalline, it's process and semiconductor device is comprising; The SiGeC mixed crystalline(Si 1-x Gex / Si1-yCy short periodic superlattice) is stacked alternately as 200 periodically the Si0.68Ge0.32 layer(102) and the Si0.98C0.04 layer(103) on Si substrate(101). Each layer(102,103) has the 3 atom layers. The formation of SiGeC mixed crystalline are performed the 3 atom layers of Si 0.68 Ge 0.32 layer(102) and the Si 0.98 C 0.04 layer(103) on Si(001) substrate(101) by UHV-CVD method with epitaxial grown alternatively. |
申请公布号 |
KR20000053487(A) |
申请公布日期 |
2000.08.25 |
申请号 |
KR20000001629 |
申请日期 |
2000.01.14 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
SAITO TORU;KAJAWA YOSIHIKO;KATAYAMA KOJI;NOJAWA KATSUYA;SUKA HARAKAKU;KUBO MINORU |
分类号 |
C30B23/02;H01L21/20;H01L29/10;H01L29/15;H01L29/165 |
主分类号 |
C30B23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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