X-ray analysis position comparison and spectral analysis, comprises altering spectral position of diffraction lines by single defined change in position of test item, and repeating measurement of emission spectrum

摘要

In a first stage the spectral position of the diffraction lines is altered by a single defined change in the position of the test item, followed by a repeat measurement of the emission spectrum and comparison of the emissions against the two positions. Those parts of the spectrum which remain unchanged are separated and analyzed by conventional X-ray fluorescent analysis. In a first stage the spectral position of the diffraction lines is altered by a single defined change in the position of the test item, followed by a repeat measurement of the emission spectrum and comparison of the emissions against the two positions. Those parts of the spectrum which remain unchanged are separated and analyzed by conventional X-ray fluorescent analysis. The positions measured are determined using the first-stage diffraction lines and determination of the characteristic crystalline values of the test items, and detection of mono-crystalline zones (m) within the test item. The final stage systematically repeats determination of the characteristic crystalline values, and determines the symmetrical elements within the crystal structure and/or the crystal orientation using a conventional crystallography process.