发明名称 Process of fabricating semiconductor device
摘要 <p>A process of fabricating a semiconductor device which has a wiring layer and active elements on a semiconductor substrate, the wiring layer and the active elements being protected by a protective film, and is provided with a projected electrode for connection with a outside in an opening portion of the protective film on an Al electrode pad electrically connected to the wiring layer, which comprises the steps of: removing by sputtering a surface oxide film formed on a surface of the Al electrode pad; depositing a film of a first metal on the Al electrode pad by substituting the first metal with Al constituting the Al electrode pad; and depositing a film of a second metal for constituting the projected electrode on the film of the first metal by substituting the first metal with the second metal, and forming the projected electrode by electroless plating by use of autocatalytic reaction. <IMAGE> <IMAGE> <IMAGE> <IMAGE></p>
申请公布号 EP1030356(A2) 申请公布日期 2000.08.23
申请号 EP20000300858 申请日期 2000.02.03
申请人 SHARP KABUSHIKI KAISHA 发明人 YAMAGUCHI, SHINJI
分类号 H01L23/52;H01L21/288;H01L21/3205;H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L23/52
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