发明名称 APPARATUS AND METHODS FOR CONTROLLING WORKPIECE SURFACE EXPOSURE TO PROCESSING LIQUIDS DURING THE FABRICATION OF MICROELECTRONIC COMPONENTS
摘要 An apparatus (10) for use in processing a workpiece (W) to fabricate a microelectronic component is set forth. The apparatus comprises a process container (14) having a process fluid (38) therein for processing the workpiece and a workpiece holder (16) configured to hold the workpiece. A position sensor is employed to provide position information indicative of the spacing between a surface (S1) of the workpiece and a surface (39) of the process fluid. A drive system provides relative movement between the surface of the workpiece and the surface of the process fluid in response to the position information. Preferably, the relative movement provided by the drive system comprises a first motion that causes the surface of the workpiece to contact the surface of the process fluid, and a second motion opposite the direction all of and following the first to generate and maintain a column of process fluid between the surface of the process fluid and the surface of the workpiece. In one embodiment, the apparatus is configured to electroplate a material onto the surface of the workpiece.
申请公布号 EP1029342(A1) 申请公布日期 2000.08.23
申请号 EP19980950863 申请日期 1998.09.30
申请人 SEMITOOL, INC. 发明人 BATZ, ROBERT, W., JR.;BLACKBURN, REED, A.;KELLY, STEVEN, E.;DOOLITTLE, JAMES, W.
分类号 C25D5/08;C25D7/12;C25D21/12;H01L21/00;H01L21/68;(IPC1-7):H01L21/00 主分类号 C25D5/08
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