发明名称 Surface preparation method and semiconductor device
摘要 A surface preparation method and semiconductor device constituted so as to enable the prevention of carrier accumulation resulting from Si acting as a donor, without making the constitution of a semiconductor manufacturing apparatus complex. When forming an epitaxial layer either on the surface of a substrate, or on the surface of a base layer, Si or an Si compound that exists on the surface of a substrate, or on the surface of a base layer, is removed in accordance with a thermal cleaning process that uses an As hydride gas as the cleaning gas. <IMAGE>
申请公布号 EP0994504(A3) 申请公布日期 2000.08.23
申请号 EP19990120467 申请日期 1999.10.14
申请人 DOWA MINING CO., LTD. 发明人 SAKAMOTO, RYO;TOBA, RYUICHI;IKEDA, HIROYUKI
分类号 H01L21/302;H01L21/205;H01L21/306;H01L21/3065 主分类号 H01L21/302
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