发明名称 |
Surface preparation method and semiconductor device |
摘要 |
A surface preparation method and semiconductor device constituted so as to enable the prevention of carrier accumulation resulting from Si acting as a donor, without making the constitution of a semiconductor manufacturing apparatus complex. When forming an epitaxial layer either on the surface of a substrate, or on the surface of a base layer, Si or an Si compound that exists on the surface of a substrate, or on the surface of a base layer, is removed in accordance with a thermal cleaning process that uses an As hydride gas as the cleaning gas. <IMAGE> |
申请公布号 |
EP0994504(A3) |
申请公布日期 |
2000.08.23 |
申请号 |
EP19990120467 |
申请日期 |
1999.10.14 |
申请人 |
DOWA MINING CO., LTD. |
发明人 |
SAKAMOTO, RYO;TOBA, RYUICHI;IKEDA, HIROYUKI |
分类号 |
H01L21/302;H01L21/205;H01L21/306;H01L21/3065 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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