发明名称 Multilevel interconnection structure
摘要 In producing a multilevel interconnection structure, an insulator film is placed on and bonded to interconnecting lines laid on an insulating layer on a semiconductor substrate such that all the spacings between the interconnecting lines are left as vacant spaces. For example, the insulator film is a polyimide film or a silicon oxide film. The vacant spaces serve the purpose of reducing capacitance between adjacent interconnecting lines. After forming contact holes in the insulator film and filling the contact holes with a metal, upper-level interconnecting lines are laid on the insulator film.
申请公布号 GB2306776(B) 申请公布日期 2000.08.23
申请号 GB19960021699 申请日期 1996.10.17
申请人 * NEC CORPORATION 发明人 SHINYA * ITO
分类号 H01L21/285;H01L21/28;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L23/522 主分类号 H01L21/285
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