发明名称 |
Method for fabricating a semiconductor device having a tapered contact hole |
摘要 |
A semiconductor device includes: a field oxide layer formed on a semiconductor substrate; a transistor having an active region formed on a semiconductor substrate; an interlayer insulating layer formed on the transistor and the field oxide; and a tapered contact hole exposing the active region adjacent to the field oxide layer, wherein an upper portion of the tapered contact hole is wider than a lower portion thereof so that the field oxide is not etched during the contact hole etching process. A method for fabricating a semiconductor device includes the steps for: forming a field oxide layer on a semiconductor substrate; forming a transistor having an active region on a semiconductor substrate; forming an interlayer insulating layer on the resulting structure; and forming a tapered contact hole exposing the active region adjacent to the field oxide layer, wherein an upper portion of the tapered contact hole is wider than a lower portion thereof so that the field oxide is not etched during the contact hole etching process.
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申请公布号 |
US6107138(A) |
申请公布日期 |
2000.08.22 |
申请号 |
US19960744805 |
申请日期 |
1996.11.06 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
JEONG, EI SAM;KIM, SANG WOOK;LEE, BYUNG SUK;YOON, YONG HYEOCK |
分类号 |
H01L21/302;H01L21/02;H01L21/28;H01L21/3065;H01L21/768;H01L21/8242;H01L23/522;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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