发明名称 Method for fabricating a semiconductor device having a tapered contact hole
摘要 A semiconductor device includes: a field oxide layer formed on a semiconductor substrate; a transistor having an active region formed on a semiconductor substrate; an interlayer insulating layer formed on the transistor and the field oxide; and a tapered contact hole exposing the active region adjacent to the field oxide layer, wherein an upper portion of the tapered contact hole is wider than a lower portion thereof so that the field oxide is not etched during the contact hole etching process. A method for fabricating a semiconductor device includes the steps for: forming a field oxide layer on a semiconductor substrate; forming a transistor having an active region on a semiconductor substrate; forming an interlayer insulating layer on the resulting structure; and forming a tapered contact hole exposing the active region adjacent to the field oxide layer, wherein an upper portion of the tapered contact hole is wider than a lower portion thereof so that the field oxide is not etched during the contact hole etching process.
申请公布号 US6107138(A) 申请公布日期 2000.08.22
申请号 US19960744805 申请日期 1996.11.06
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 JEONG, EI SAM;KIM, SANG WOOK;LEE, BYUNG SUK;YOON, YONG HYEOCK
分类号 H01L21/302;H01L21/02;H01L21/28;H01L21/3065;H01L21/768;H01L21/8242;H01L23/522;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/302
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