发明名称 Semiconductor device and method of manufacturing the same
摘要 Since a field effect MOS transistor can be formed with a reduced number of manufacturing processes, a semiconductor integrated circuit device can be materialized at a low cost. A semiconductor device has a structure in which a gate electrode is provided in the vicinity of the surface of a semiconductor substrate through a gate insulating film, a second conductive type heavily doped impurity region is provided in a region adjacent to a part of the gate electrode through a part of the gate insulating film and a part of a thick oxide film, another second conductive type heavily doped impurity region is provided in a region adjacent to an opposite part of the gate electrode opposing the part of the gate electrode through the part of the gate insulating film and a part of another thick oxide film, and a first conductive type heavily doped impurity region for device isolation is provided so as to surround the gate electrode and the second conductive type heavily doped impurity regions.
申请公布号 US6107128(A) 申请公布日期 2000.08.22
申请号 US19990324693 申请日期 1999.06.02
申请人 SEIKO INSTRUMENTS INC. 发明人 ISHII, KAZUTOSHI;GOTOU, SUMITAKA;MOYA, YASUHIRO;KITTA, TATSUYA;KANAKUBO, YOSHIHIDE
分类号 H01L29/78;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L29/78
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