发明名称 Repair circuit for redundancy circuit with anti-fuse
摘要 A repair circuit for a redundancy circuit which replaces a failed circuit with the redundancy circuit using a fuse, wherein the fuse is an anti-fuse programmed by its conduction due to a dielectric breakdown. A repair operation can be performed at a package step of a memory device, by using the anti-fuse conducting due to the dielectric breakdown.
申请公布号 US6108261(A) 申请公布日期 2000.08.22
申请号 US19990342509 申请日期 1999.06.29
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 KIM, YOUNG-HEE;KU, KIE-BONG
分类号 G06F12/16;G11C17/18;G11C29/00;G11C29/04;H01H85/00;H01H85/02;H01H85/046;H01H85/30;H01H85/46;(IPC1-7):G11C7/00 主分类号 G06F12/16
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