发明名称 |
Repair circuit for redundancy circuit with anti-fuse |
摘要 |
A repair circuit for a redundancy circuit which replaces a failed circuit with the redundancy circuit using a fuse, wherein the fuse is an anti-fuse programmed by its conduction due to a dielectric breakdown. A repair operation can be performed at a package step of a memory device, by using the anti-fuse conducting due to the dielectric breakdown.
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申请公布号 |
US6108261(A) |
申请公布日期 |
2000.08.22 |
申请号 |
US19990342509 |
申请日期 |
1999.06.29 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
KIM, YOUNG-HEE;KU, KIE-BONG |
分类号 |
G06F12/16;G11C17/18;G11C29/00;G11C29/04;H01H85/00;H01H85/02;H01H85/046;H01H85/30;H01H85/46;(IPC1-7):G11C7/00 |
主分类号 |
G06F12/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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