发明名称 Polishing pad having a wear level indicator and system using the same
摘要 A polishing pad having a wear level indicator and a polishing system employing the same is provided. A polishing pad, in accordance with one embodiment of the invention, includes a pad structure and an indicator, disposed in the pad structure, indicating the wear level of the pad structure. The pad structure may, for example, include a top pad and a bottom pad with the indicator being disposed in the top pad. The wear level may, for example, be a critical thickness of the polishing pad which indicates the end of the pad lifetime or which indicates the need to change polishing processing. The use of a wear level indicator allows for efficient and reliable pad wear level indication.
申请公布号 US6106661(A) 申请公布日期 2000.08.22
申请号 US19980074892 申请日期 1998.05.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 RAEDER, CHRISTOPHER H.;SHIPLEY, KEVIN D.;BURKE, PETER A.
分类号 B24B37/04;B24D13/14;(IPC1-7):C23F1/02 主分类号 B24B37/04
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