发明名称 |
CONTACT PROBE EQUIPED WITH TUNGSTEN NEEDLE AND PROBE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To make adjustable a characteristic impedance with use of a tungsten needle, and reduce external noises and signal losses at high frequencies. SOLUTION: Base parts 6b... of a plurality of tungsten needles 6... are soldered to electrodes of a printed board. Middle parts are fixed to a holding part 16 and leading end parts 6a are curved. A double-layer film 20 is applied via an adhesive from each of the base parts 6b... of the tungsten needles 6... to the holding part 16, thereby constituting a contact probe 14. The double-layer film 20 is comprised of an insulating resin film 22 and a grounded metallic film 24 of a good conductivity. The contact probe 14 constitutes a microstrip line.
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申请公布号 |
JP2000230938(A) |
申请公布日期 |
2000.08.22 |
申请号 |
JP19990030696 |
申请日期 |
1999.02.08 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
ASO TAKESHI;KATO NAOKI;YOSHIDA HIDEAKI;IWAMOTO TAKAFUMI |
分类号 |
G01R31/26;G01R1/073;H01L21/66;(IPC1-7):G01R1/073 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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