发明名称 |
Test apparatus for time dependent dielectric breakdown |
摘要 |
A test structure and test fixture which are capable of measuring time dependent dielectric breakdown under accelerated temperature test conditions which can extend to 300 DEG C. The test structure is a parallel plate configuration with metal electrodes which is insensitive to polarity. The test fixture employs a ceramic or polymide body which remains rigid and well isolated electrically under these test conditions
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申请公布号 |
US6107816(A) |
申请公布日期 |
2000.08.22 |
申请号 |
US19970846743 |
申请日期 |
1997.04.30 |
申请人 |
LUCENT TECHNOLOGIES INC. |
发明人 |
KEARNEY, JOSEPH WILLIAM;WROGE, DANIEL M. |
分类号 |
G01R31/12;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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