发明名称 |
APPARATUS FOR DETECTING PRESSURE FOR SEMICONDUCTOR PROCESSING MACHINE |
摘要 |
PURPOSE: An apparatus for detecting pressure for semiconductor processing machine is provided to detect an actual inner pressure of a chamber. CONSTITUTION: A pressure detector(200) detects an inner pressure of a chamber performing LPCVD, diffusion, or etching process with low or vacuum state. It includes a case(210), a diaphragm(220), a pressure converter(230), and a display(240). An inner space of a case is divided to reference(211) and general(212) pressure rooms by a diaphragm. A pressure of a reference room is same to an atmospheric pressure because it includes an inlet tube(213) directed to an outer atmosphere. A general pressure room having an inlet tube (214) is same to an inner one of a chamber(10). Then a shape of a diaphragm is transformed by a pressure difference between two rooms. A pressure converter placed at inside of a reference room detects the pressure of a general pressure room according transform action of a diaphragm. A display connected to a signal transmission line(231) shows an inner pressure of a general pressure room with a detected signal of a pressure converter.
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申请公布号 |
KR20000052078(A) |
申请公布日期 |
2000.08.16 |
申请号 |
KR19990002902 |
申请日期 |
1999.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JAE HUN;PARK, JUN HYEON |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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