发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided which can prevent a polycrystalline silicon residue from being remained on a peripheral circuit region. CONSTITUTION: According to a method for fabricating a semiconductor device, an insulation layer(6) pattern is located on top of a peripheral circuit region before a polycrystalline silicon for forming a plug is deposited. Then, a plug(5) is formed by depositing and planarizing the polycrystalline silicon, and the insulation layer pattern is removed. Therefore, it is prevented for the polycrystalline silicon to be remained on a side of a gate formed on the peripheral circuit region after the etching of the polycrystalline silicon. Thus, the reliability and the characteristics of the semiconductor device is improved.
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申请公布号 |
KR20000051805(A) |
申请公布日期 |
2000.08.16 |
申请号 |
KR19990002447 |
申请日期 |
1999.01.26 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
BYUN, JOONG HYUK;LEE, EUNG SUK |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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