发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided which can prevent a polycrystalline silicon residue from being remained on a peripheral circuit region. CONSTITUTION: According to a method for fabricating a semiconductor device, an insulation layer(6) pattern is located on top of a peripheral circuit region before a polycrystalline silicon for forming a plug is deposited. Then, a plug(5) is formed by depositing and planarizing the polycrystalline silicon, and the insulation layer pattern is removed. Therefore, it is prevented for the polycrystalline silicon to be remained on a side of a gate formed on the peripheral circuit region after the etching of the polycrystalline silicon. Thus, the reliability and the characteristics of the semiconductor device is improved.
申请公布号 KR20000051805(A) 申请公布日期 2000.08.16
申请号 KR19990002447 申请日期 1999.01.26
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 BYUN, JOONG HYUK;LEE, EUNG SUK
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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