发明名称 |
AUTOMATIC TEACHING COMPENSATION APPARATUS FOR SEMICONDUCTOR MAPPING MACHINE |
摘要 |
PURPOSE: An apparatus is provided to increasing a mapping accuracy by matching mapping sensors placed at both sides of the apparatus automatically. CONSTITUTION: A mapping unit(20) detects a loading state of a wafer(W) after loading it to each cassette with a robot unit(10). For this operation, a laser oscillator(21) radiates laser beam to a beam splitter(22). The mapping sensors(160) detecting the splitted beam adjust positions of the robot unit and mapping unit to perform a next mapping operation. If an abnormal mapping operation occurs, the mapping sensors of robot unit are reassembled. In that case, each photo sensor(162) recognizes a present position with reference parts(161) and provides a corresponding signal to a main board. The main board controls a step motor(130) placed under the mapping sensor to place the mapping sensors in the horizontal line so a correct position compensation is achieved as well as reducing the reassembling time.
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申请公布号 |
KR20000051300(A) |
申请公布日期 |
2000.08.16 |
申请号 |
KR19990001655 |
申请日期 |
1999.01.20 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
SHIN, GWANG HO |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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