发明名称 Optical characteristic measurement system
摘要 An optical characteristic measurement system which can measure optical characteristics of an optical device precisely and stably without being affected by the polarization-dependent loss of optical components in the optical characteristic measurement system. The optical characteristic measurement system includes a multi-wave optical source for generating a signal light of linear polarization having a plurality of wavelengths each different from each other, a polarization scrambler for scrambling the polarization direction of the signal light to be supplied to a device under test, and an average power measurement unit for measuring an average power of the signal light outputted from the device under test, for each of the wavelengths.
申请公布号 US6104477(A) 申请公布日期 2000.08.15
申请号 US19980219612 申请日期 1998.12.23
申请人 NEC CORPORATION 发明人 YOSHIDA, MASANORI;WATANABE, SEIJI
分类号 G01M11/00;G02B6/00;H04B10/08;H04B10/135;(IPC1-7):G01N21/00 主分类号 G01M11/00
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