发明名称 |
Optical characteristic measurement system |
摘要 |
An optical characteristic measurement system which can measure optical characteristics of an optical device precisely and stably without being affected by the polarization-dependent loss of optical components in the optical characteristic measurement system. The optical characteristic measurement system includes a multi-wave optical source for generating a signal light of linear polarization having a plurality of wavelengths each different from each other, a polarization scrambler for scrambling the polarization direction of the signal light to be supplied to a device under test, and an average power measurement unit for measuring an average power of the signal light outputted from the device under test, for each of the wavelengths.
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申请公布号 |
US6104477(A) |
申请公布日期 |
2000.08.15 |
申请号 |
US19980219612 |
申请日期 |
1998.12.23 |
申请人 |
NEC CORPORATION |
发明人 |
YOSHIDA, MASANORI;WATANABE, SEIJI |
分类号 |
G01M11/00;G02B6/00;H04B10/08;H04B10/135;(IPC1-7):G01N21/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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