发明名称 Method to improve the short circuit current of the porous silicon photodetector
摘要 The rapid thermal oxidation (RTO) and rapid thermal annealing(RTA) were used to improve the photo-current and photoresponsivity of porous silicon photodetector. In addition, we remove the surface oxide of the porous silicon under the metal grid using the same mask, and enhance the photo-current of porous silicon photodetector at zero bias voltage. This invention removes the limitation of application of the porous silicon photodetector.
申请公布号 US6103546(A) 申请公布日期 2000.08.15
申请号 US19980041679 申请日期 1998.03.13
申请人 NATIONAL SCIENCE COUNCIL 发明人 LEE, MING-KWEI
分类号 H01L31/028;H01L31/18;(IPC1-7):H01L31/18 主分类号 H01L31/028
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