发明名称 |
Silicon-system thin film, photovoltaic device, method for forming silicon-system thin film, and method for producing photovoltaic device |
摘要 |
This invention provides a silicon-system thin film, characterized by containing at least 1 ppm of phosphorus atoms and diffraction intensity at the (220) plane with X ray or electron beams of at least 30% of total diffraction intensity, photovoltaic device that contains the silicon-system thin film, and methods for forming the silicon-system thin film and photovoltaic device. These methods give the silicon-system thin film and photovoltaic device of high photoelectric conversion efficiency at a high film-making rate.
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申请公布号 |
US6103138(A) |
申请公布日期 |
2000.08.15 |
申请号 |
US19990232699 |
申请日期 |
1999.01.19 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
KONDO, TAKAHARU |
分类号 |
H01L31/0368;H01L31/075;H01L31/18;H01L31/20;(IPC1-7):H02N6/00;H01L27/142 |
主分类号 |
H01L31/0368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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