发明名称 SURFACE SHAPE MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To eliminate measurement error caused by temperature dependency of measuring apparatus during long term measurement. SOLUTION: Data of a measurement start point 2 is measured after measuring the data of the first line 11 by scanning an XY table in X-axis direction and data of measurement start point 2 is measured after data of the second line 12 is measured. This scanning is repeated by turns and the data at every measurement at the measurement start point 2 is compared so that the error caused during the measurement is corrected to measure exact surface shape.
申请公布号 JP2000227325(A) 申请公布日期 2000.08.15
申请号 JP19990028249 申请日期 1999.02.05
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HAMADA TAIZO;MAKABE TOSHIO
分类号 G01B11/30;G01B21/30;(IPC1-7):G01B21/30 主分类号 G01B11/30
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