发明名称 |
SURFACE SHAPE MEASURING DEVICE AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To eliminate measurement error caused by temperature dependency of measuring apparatus during long term measurement. SOLUTION: Data of a measurement start point 2 is measured after measuring the data of the first line 11 by scanning an XY table in X-axis direction and data of measurement start point 2 is measured after data of the second line 12 is measured. This scanning is repeated by turns and the data at every measurement at the measurement start point 2 is compared so that the error caused during the measurement is corrected to measure exact surface shape.
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申请公布号 |
JP2000227325(A) |
申请公布日期 |
2000.08.15 |
申请号 |
JP19990028249 |
申请日期 |
1999.02.05 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HAMADA TAIZO;MAKABE TOSHIO |
分类号 |
G01B11/30;G01B21/30;(IPC1-7):G01B21/30 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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