发明名称 QUALITY DETERMINING METHOD FOR CAPACITOR
摘要 PROBLEM TO BE SOLVED: To provide a quality determining method, whereby the quality state of a capacitor can be determined in a short time. SOLUTION: This determining method makes a quality determination on a capacitor by using a charging property for applying dc voltage to a capacitor. A standard selection current value I0 of a dielectric polarization component is determined in advance regarding the capacitor, and an evaluation function n(t) is computed by a logarithmic value of the difference between a measurement current value m(t) of the measured capacitor and the standard selection current value I0, or the difference between the respective logarithmic values. Then a quadric curve approximation is made on the evaluation function n(t). Subsequently, when the secondary coefficient of a quadric curve approximate expression is positive, the capacitor is determined as being defective, and when the coefficient is negative, the capacitor is determined as being non-detective.
申请公布号 JP2000228337(A) 申请公布日期 2000.08.15
申请号 JP19980348347 申请日期 1998.12.08
申请人 MURATA MFG CO LTD 发明人 NISHIOKA YOSHINAO;KITAGAWA MITSURU
分类号 H01G13/00;G01R31/00;G01R31/01;G01R31/28;(IPC1-7):H01G13/00 主分类号 H01G13/00
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