发明名称 Corrosion sensitivity structures for vias and contact holes in integrated circuits
摘要 A die including a corrosion monitoring feature is described. The die includes: (i) a surface including an active die region and a scribeline region that is adjacent the active die region; (ii) an insulating layer disposed above the surface and includes a first corrosion sensitive metal plug and a second corrosion sensitive metal plug in the scribeline region; and (iii) a metallization layer positioned above the insulating layer, the first corrosion sensitive metal plug and the second corrosion sensitive metal plug in the scribeline region and the metallization layer disposed above second corrosion sensitive metal plug is patterned to provide the metallization layer with a first opening extending from a top surface of the metallization layer down to a top surface of the second corrosion sensitive metal plug such that a solvent introduced above the top surface of the metallization layer flows into the second corrosion sensitive metal plug disposed below through the first opening in the metallization layer.
申请公布号 US6103615(A) 申请公布日期 2000.08.15
申请号 US19980045062 申请日期 1998.03.19
申请人 LSI LOGIC CORPORATION 发明人 SUGASAWARA, EMERY O.;ESSES, DONALD J.
分类号 H01L23/544;(IPC1-7):H01L21/476 主分类号 H01L23/544
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