发明名称 Avalanche photodiode with thin built-in depletion region
摘要 The present invention relates to an avalanche photodiode having a simple structure, high reliability, and a high speed response on the order of Gbps. This photodiode is formed by depositing laminated layers on a semiconductor substrate in the order of an n-type buffer layer, a semiconductor multiplication layer, a p-type semiconductor field buffer layer, a p-type semiconductor light absorbing layer, a p-type semiconductor cap layer, and a p-type semiconductor contact layer, and said p-type semiconductor light absorbing layer is constructed by two layers consisted of a depleted region of a thickness in the range of 10 nm to 0.3 mu m disposed adjacent to the p-type semiconductor field buffer layer and a non-depleted layer region at a thickness of less than 2 mu m disposed adjacent to the depleted layer region.
申请公布号 US6104047(A) 申请公布日期 2000.08.15
申请号 US19990345975 申请日期 1999.07.01
申请人 NEC CORPORATION 发明人 WATANABE, ISAO
分类号 H01L31/0352;H01L31/107;(IPC1-7):H01L31/032 主分类号 H01L31/0352
代理机构 代理人
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