发明名称 Method and system for providing a contact on a semiconductor device
摘要 A method for providing at least one contact on a semiconductor is disclosed. The semiconductor includes a plurality of isolation structures. The method and system include providing an etch-stop layer in direct contact with the semiconductor, providing a dielectric layer over the etch-stop layer, and etching through the dielectric layer and a portion of the etch-stop layer. A portion of the semiconductor in proximity with one of the plurality of isolation structures is not exposed during the etch.
申请公布号 US6103593(A) 申请公布日期 2000.08.15
申请号 US19980023836 申请日期 1998.02.13
申请人 ADVANCED MICRO DEVICES, INC. 发明人 HUI, ANGELA T.;CHEN, HUNG-SHENG;KIM, UNSOON
分类号 H01L21/762;H01L21/768;(IPC1-7):H01L21/76;H01L21/44 主分类号 H01L21/762
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