发明名称 POSITIVE RADIATION-SENSITIVE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide the positive radiation-sensitive composition having a resolution capable of microfabricating a subquarter micron pattern and high sensitivity by incorporating a polymer having specified structural units and a compound to be allowed to generate an acid by irradiation with radiation. SOLUTION: This composition contains the acid generator capable of generating an acid by irradiation with activated rays and the polymer having the structural units each represented by the formula in which X is a halogen atom, such as I, Br, Cl, or F, or a cyano group; Z is an O atom or an imino group; R is a primary or secondary 1-10C alkylene group, embodied by methylene, ethylene, or trimethylene; and A is an aryl group having at least one group to be decomposed and solubilized in alkali by action of an acid, especially preferably, an H atom of a phenolic hydroxyl group substituted by an acid- removing group.
申请公布号 JP2000227660(A) 申请公布日期 2000.08.15
申请号 JP19990323894 申请日期 1999.11.15
申请人 TORAY IND INC 发明人 TAMURA KAZUTAKA;OBAYASHI GENTARO
分类号 H01L21/027;G03F7/039 主分类号 H01L21/027
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