发明名称 SOLID STATE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a solid state device in which decrease in the on/off ratio, decrease in the tunnel current during resonance and lowering of coherence of electronic wave can be lessened. SOLUTION: A single electron tunnel element is fabricated of a semiconductor substrate 2, a laminate structure 1 of semiconductor layers 3, 4, a two-dimensional electron gas layer 5, a device structure region 10 formed by etching process, a depletion region 9, a source side two-dimensional electron gas region 6, a drain side two-dimensional electron gas region 7, and a dot-like two-dimensional electron gas region 8. Furthermore, an etching structure 11 is provided to surround the depletion region 9 of a single electron tunnel element thus constituting a resonance structure 12.
申请公布号 JP2000223694(A) 申请公布日期 2000.08.11
申请号 JP19990019960 申请日期 1999.01.28
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 FUJISAWA TOSHIMASA
分类号 H01L29/66;H01L29/06;H01L39/22;H03K17/58;(IPC1-7):H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项
地址