| 摘要 |
PROBLEM TO BE SOLVED: To make it possible to execute the insertion work of an inspection circuit capable of inspecting a semiconductor integrated circuit consisting of plural function blocks without requiring manual operation. SOLUTION: In an integrated circuit information analyzing process 31, integrated circuit information 21 is read, the circuit structure is analyzed and connection relation information is generated for every function block. In a pin correspondence specification information analyzing process 32, pin correspondence specification information 22 including input correspondence relation information between an input pin in each prepared function block and a test inputting external pin and output correspondence relation information between an output pin and a test outputting external pin is read, the contents of the read information are analyzed and pin correspondence information 33 having a structure processable by a computer, e.g. is generated. In an inspectable circuit information output process 34, an inspection input circuit and an inspection output circuit are added to the connection relation information on the basis of the information 33 and inspectable integrated circuit information 23 is outputted. |
