发明名称 |
SEMICONDUCTOR DEVICE AND ITS FABRICATION |
摘要 |
PROBLEM TO BE SOLVED: To reduce chip size by integrating a plurality of memory cells in a plurality of ROMs arranged in X direction as word lines and connecting the drain regions and source regions of a plurality of memory cells arranged in Y direction commonly with respective bit lines and source lines. SOLUTION: Source region 23 and drain region 24 on the major surface of a semiconductor substrate 1 is covered with an insulation film 7 of silicon oxide and laminated with a gate 28 of polycide film laminated with a polysilicon film and a high melting point metal silicide, e.g. tungsten silicide, through a gate insulation film 26 of silicon oxide film. The gate 28 is connected with the gate 28 of an FET in other block adjacent in X direction by specified number and it is a word line extending in X direction. A common source line is connected with a common source region 23 and a main bit line is connected with a common drain region 24 through a select FET provided at the other end of each element forming region.
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申请公布号 |
JP2000223595(A) |
申请公布日期 |
2000.08.11 |
申请号 |
JP19990025723 |
申请日期 |
1999.02.03 |
申请人 |
HITACHI LTD |
发明人 |
TAKAHASHI MASATO;KOMORI KAZUHIRO |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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