发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, by siliciding not only a gate electrode and source/drain region of MOS but also an electrode region of a bipolar transistor. SOLUTION: A semiconductor device 100 is of a BiCMOS type in which in PMOS and NMOS regions 18 and 20, as in prior art BiCMOS semiconductor device, a P+-region 48 (source/drain region), an N+-region 44 (source/drain region) and a gate electrode 40 are silicided in their surface layers, for example, as a silicide layer 70. In an NPN region 14 of the semiconductor device, surface layers of N+ and P+ regions 24 and 48 are silicided for example, as a silicide layer 70 of CoSi, while surface layers of P+ and N+ regions 32 and 44 are silicided for example, as, a silicide layer 70 of CoSi.
申请公布号 JP2000223600(A) 申请公布日期 2000.08.11
申请号 JP19990022207 申请日期 1999.01.29
申请人 NEC CORP 发明人 YOSHIDA HIROSHI
分类号 H01L29/73;H01L21/28;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H03L7/00;(IPC1-7):H01L21/824;H01L21/822 主分类号 H01L29/73
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