| 摘要 |
PROBLEM TO BE SOLVED: To make it possible to quickly execute a fault simulation with a small error in fault detection ratio. SOLUTION: In a fault simulation, a pattern input part 14 inputs a test pattern to a tested circuit whose fault generation is supposed by a fault supposing part 12. A fault simulation part 16 executes a fault simulation based on the inputted test pattern and simultaneously counts up operation differences. A potential detection frequency calculation part 20 counts up the number of times of potential detection. When the operation differences counted up by the fault simulation part 16 and the potential detection frequency counted by the calculation part 20 exceed respective thresholds, a threshold comparing part 22 deletes the supposed fault to execute fault simulation.
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