发明名称 |
CHEMICAL POLISHING METHOD OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a highly efficient chemical polishing method for semiconductor substrate in which the surface of a semiconductor substrate can be finished with extremely high smoothness using a chemical. SOLUTION: A semiconductor substrate W is mounted on the rotary plate 11 of a chemical polishing apparatus 10 and then the rotary plate 12 is turned at high speed. At the same time, chemical S is supplied from a chemical supply pipe 13 arranged in the center of the substrate W and the chemical S is fluidized relatively on the surface of the substrate W thus polishing the surface of the substrate W chemically. When the chemical S contains nitric acid and added with water or acetic acid, chemical polishing rate of becomes the reaction determining rate of the surface of the substrate W and the chemical S and surface roughening can be suppressed.
|
申请公布号 |
JP2000223468(A) |
申请公布日期 |
2000.08.11 |
申请号 |
JP19990026148 |
申请日期 |
1999.02.03 |
申请人 |
KOMATSU LTD;KOMATSU ELECTRONIC METALS CO LTD |
发明人 |
HIROZAWA ATSUHIKO;KUROKI HIDEYO;ISHII AKIHIRO |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|